Events Archive

CISCEM 2016

October 11, 2016

Saarbrucken, Germany

DELMIC attended and sponsored CISCEM 2016, an international conference on in-situ and correlative electron microscopy. Jacob Hoogenboom of the Technical University of Delft, who played a very important role developing the SECOM correlative light and electron microscope, provided a presentation at the conference.

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EMC

August 28, 2016

Lyon, France

For the 2016 edition of the European Microscopy Congress (EMC), DELMIC organized a very large booth featuring both the SPARC and SECOM systems.

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School of Photonics 2016

July 10, 2016

Cortona, Italy

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BIAMS

June 5, 2016

Versailles

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Photonics 2016

June 1, 2016

Veldhoven

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Bridging Nordic Imaging

April 14, 2016

Gothenburg

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Focus on Microscopy

March 20, 2016

Taipei

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Seminar: Integrating optical with electron microscopy

January 29, 2016

Singapore

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Quantitative Bioimaging Conference

January 13, 2016

Delft

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MicroNanoConfence

December 8, 2015

Amsterdam

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NVvM Materials Science Meeting

November 3, 2015

Eindhoven

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Seeing is Believing 2015

October 6, 2015

Heidelberg

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Delphi workshop

October 5, 2015

Heidelberg

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Delphi workshop

September 1, 2015

Maastricht

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M&M 2015

August 2, 2015

Portland, booth 338

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MMC 2015

June 29, 2015

Manchester, booth 102

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Delphi workshop

June 24, 2015

Francis Crick Institute, London

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Delphi workshop

June 18, 2015

CFIM, University of Copenhagen

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Colloquium CL

June 18, 2015

MESA+, Applied Nanophotonics

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Seminar CL Applications

June 16, 2015

DTU-CEN

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