DELMIC returns from the successful launch of its super-resolution CLEM system at FOM 2016
March 31, 2016
Image: The stand featuring our integrated micrscopy solutions at FOM 2016
DELMIC has recently returned from a very successful edition of the Focus on Microscopy meeting. This was a pivotal event for us as it marked the official launch of the latest version of the SECOM correlative light and electron microscopy system, the Super-Resolution SECOM.