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DELMIC returns from the successful launch of its super-resolution CLEM system at FOM 2016

DELMIC has recently returned from a very successful edition of the Focus on Microscopy meeting. This was a pivotal event for us as it marked the official launch of the latest version of the SECOM correlative light and electron microscopy system, the Super-Resolution SECOM.

Our stand featuring our integrated micrscopy solutions at FOM 2016

Image: The stand featuring our integrated micrscopy solutions at FOM 2016

This super-resolution CLEM system is a truly remarkable innovation in the field, as it is able to offer benefits with features that were previously only available in electron microscopy, with the additional advantage of the labelling power of fluorescence microscopy. In particular, SR microscopy offers the possibility to localize biomolecules, making it an extremely powerful and important tool in biological research. The system that is now being offered by DELMIC is unsurpassed in terms of high-quality super resolution imaging.

At FOM, we hosted a booth featuring our products and our CLEM application specialist Lennard Voortman gave a talk on super-resolution. This year’s event was hosted at Taipei in Taiwan, which also made it a special opportunity for us to become acquainted with some interesting contacts in Asia.

Already within a few weeks, we will be attending our next microscopy event in Gothenburg: Bridging Nordic Imaging. To stay up to date with our events, you can check our Upcoming Events page. We are always happy to discuss microscopy matters in person, so please do not hesitate to approach us!

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