DELMIC will be hosting workshops on integrated correlative light and electron microscopy and sample preparation for iCLEM at the 14th European Light Microscopy Initiative meeting in Oslo.

In one workshop (W007a) we will explain everything about our SECOM platform (an integrated fluorescence and scanning electron microscope) and its applications.

In our other workshop (W007b) we will discuss the difficulties associated with integrated CLEM sample preparation and how to overcome them. If you have any questions or topics you would like to see addressed, we kindly ask you to send us an e-mail (info@delmic.com).

Hope to see you in Oslo!