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webinar, fast SEM imaging • 1 min reading time

Discover the possibilities of FAST-EM multibeam system at the official online launch

Meet FAST-EM, a system that creates a fundamental shift in electron microscopy, where unprecedented large areas can be imaged at the nanoscale while freeing up time for operators to focus on data analysis and interpretation.

We are excited to invite you to the online demonstration of FAST-EM system, a groundbreaking solution that can image biological thin samples a hundred times faster than conventional EM. Reliable and extremely fast, the system is designed to image biological samples unattended, without the need to constantly babysit the machine. 

For the first time we will be introducing the whole workflow of the system and demonstrating how fast next generation electron microscopy can be. Creating large scale 2D or even 3D images will no longer take days or weeks: with FAST-EM you can speed up your work and focus on what really matters.

You can now reserve your spot to join one of the sessions, on the 1st or 2nd of December.


During this demonstration our applications specialist Job Fermie will:

  • show the system hardware
  • go through all workflow steps
  • perform image acquisition and show the results
  • share data collected from different samples
  • demonstrate how the data is handled with our software

At the end of the demonstration, we will be happy to answer your questions.

FAST-EM online launch demonstration

Register now

Vera Lanskaya