webinar, fast SEM imaging • 1 min reading time

Join the second webinar session on high-throughput imaging

The second webinar session is coming: join to learn more about our upcoming high-throughput system

In the first webinar our applications specialist Job Fermie talked about current challenges of electron microscopy and what would be possible without major limitations. He covered the basics of high-throughput imaging and the applications enabled by faster and automated electron microscopes. Job also discussed how large-scale electron microscopy projects require powerful and high-throughput solutions, and are currently very complex due to inefficient workflows.

We are excited to announce that we will continue the discussion on the 25th of June at 1 PM (CEST). In this upcoming webinar, we will take a closer look at the development of a system that is up to these challenges. This time Job Fermie will explain in detail Delmic’s upcoming multibeam electron microscope and present the mechanisms used to rapidly capture data with 64 beams. Finally, Job will be showing application data acquired in the development prototype.

Register now

We are looking forward to an interesting discussion and questions from you at the end of the webinar.

Vera Lanskaya