DELMIC has received the Microscopy Today Innovation Award for the SECOM platform. This prize is awarded every year to the best innovations in the field of microscopy.

The SECOM platform is an integrated solution for correlative light and electron microscopy. The SECOM integrates fluorescence and scanning electron microscopy in one device by equipping a scanning electron microscope (SEM) with an inverted fluorescence microscope.

The SECOM platform allows scientist for the first time to correlate two different types of information on the exact same cell, tissue or structure of interest. Functional information obtained with a FM can now be directly overlaid with structural information of the EM. Because of the integrated design of the SECOM platform, the need to search for a ROI is eliminated since you are always imaging in your ROI and the correlation accuracy is unrivalled since the electron and light beam axes are aligned to within 0.2 μm achieving an overlay accuracy of 50 nm. Lastly, because of the elimination of the transfer step, workflow time is and the risk of sample damage are greatly reduced.