If you answered 'Yes' to any of the above questions, then we invite you to join our upcoming webinar: Next generation electron microscopy with FAST-EM. The webinar will take place on the 22nd of June at 5 PM (CEST) and on the 23rd of June at 9 AM (CEST). Together with our speaker and applications specialist at Delmic Job Fermie we will show a full walkthrough of the FAST-EM, our new multibeam scanning electron microscope.
The system was launched at the end of last year, and now we are excited to show its full capabilities. FAST-EM can image biological thin samples at unprecedented speeds, and with a level of automation that enables large scale imaging without the need of constant supervision.
During this webinar we will go through all the steps that are required for capturing large-scale data, including:
- sample preparation
- sample exchange and loading
- creating overviews and using them to acquire data
- image acquisition
- browsing through acquired data
We will also share a link where you will be able to navigate the resulting high-resolution images yourself. In the end, we will discuss future possibilities and applications, and answer your questions.