fast SEM imaging, FAST-EM • 1 min reading time

Experience next generation electron microscopy with FAST-EM in the upcoming webinar

Are you ready to start acquiring EM images 100 times faster? Are you looking to image 3D EM volumes of unprecedented scale? Would you like to make statistically significant conclusions from your EM data, whether that is in pathology, connectomics, toxicology, or cell biology? Would you like to finally bridge the resolution gap between EM and FM for your CLEM workflow?

If you answered 'Yes' to any of the above questions, then we invite you to join our upcoming webinar: Next generation electron microscopy with FAST-EM. The webinar will take place on the 22nd of June at 5 PM (CEST) and on the 23rd of June at 9 AM (CEST). Together with our speaker and applications specialist at Delmic Job Fermie we will show a full walkthrough of the FAST-EM, our new multibeam scanning electron microscope.

The system was launched at the end of last year, and now we are excited to show its full capabilities. FAST-EM can image biological thin samples at unprecedented speeds, and with a level of automation that enables large scale imaging without the need of constant supervision.

During this webinar we will go through all the steps that are required for capturing large-scale data, including:

  • sample preparation
  • sample exchange and loading
  • creating overviews and using them to acquire data
  • image acquisition
  • browsing through acquired data

We will also share a link where you will be able to navigate the resulting high-resolution images yourself. In the end, we will discuss future possibilities and applications, and answer your questions.

Reserve your spot in one of the two available sessions to be the first one to see FAST-EM in action.

Reserve your spot

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Specifications sheet

Download FAST-EM specifications

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Vera Lanskaya