---
title: Delmic Microscopy Blog | 冷冻电子断层扫描
description: 冷冻电子断层扫描 | This blog addresses the various applications and techniques to be discovered in the fields of cathodoluminescence and correlative light and electron microscopy.
---

[![](https://blog.delmic.com/hs-fs/hubfs/Website/Blog/METEOR_MillingWorkflow_Blogpost.png?width=620&name=METEOR_MillingWorkflow_Blogpost.png) ](https://blog.delmic.com/focused-ion-beam-sample-preparation-for-cryo-electron-tomography)

###### [life sciences](https://blog.delmic.com/topic/life-sciences)

## [Focused ion beam sample preparation for cryo-electron tomography](https://blog.delmic.com/focused-ion-beam-sample-preparation-for-cryo-electron-tomography)

Cryo-electron tomography (cryo-ET) is an extremely powerful technique that allows studies of the cellular landscape at high resolution in a near-native state. Biological samples thicker than 600 nm are not electron transparent and thus require thinning to be useful for cryo-ET. To thin down the sample the use of a scanning electron microscope fitted with a focused ion beam and a cryo stage (cryo-FIB/SEM) has become the gold standard.