On 16th and 17th of January the University of Oslo hosted the workshop "Analytical SEM for Geology" organized by Delmic, Hitachi and Bruker. 24 participants came from Norway, Poland, Denmark, Sweden and UK to learn about the most advanced techniques and tools for studying geological samples. The workshop, which lasted two days, included several presentations from invited speakers, as well as hands-on sessions on SEM equipment, which can be used to study and analyse geological materials.
The first day of the workshop consisted of talks by Max Patzschke and Laurie Palasse from Bruker on the advanced microanalysis and characterization of mineralogical samples with electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS). Tobias Salge from Natural History Museum of London presented his research on Macro, to Micro to Nanoscale Advanced SEM/EDS of Earth and Planetary Materials. Finally, Toon Coenen from Delmic talked abou