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CL Solutions

Cathodoluminescence solutions that reveal fundamental properties of matter
Cryo Solutions

Integrated and automated solutions to unlock the power of cryo-ET workflow
FAST IMAGING

Fast EM solutions for reliable and high throughput electron microscopy
- FAST-EM
CLEM Solutions

Integrated correlative microscopy solutions that combine the power of fluorescence and electron microscopy
- SECOM

News

Delmic open-source software ODEMIS

company news

New features in our open-source software ODEMIS

We are continuously working on our open-source software ODEMIS, which is used for data acquisition and analysis with our CL systems (SPARC Spectral, SPARC Compact, JOLT) and CLEM systems (SECOM, DELPHI).

software

New version of our ODEMIS microscopy software package released

software

New and improved stable version of ODEMIS software package