materials science, SPARC • 1 min reading time

New technical note on cathodoluminescence intensity mapping available

You can now access our latest technical note on cathodoluminescence intensity mapping.

Intensity mapping records the CL intensity for every beam position on the sample using a single-pixel light detector. This is carried out using a photomultiplier tube with a filter wheel. This method is ideal for carrying out fast scanning of relatively large samples at a nanoscale resolution. Intensity mapping has the greatest potential for geoscientists, but can also be used for many other applications in materials science.

To learn more, click on the link below to download the technical note.

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Kaitlin van Baarle