DELMIC’s Toon Coenen contributed to the paper Angle-Resolved Cathodoluminescence Imaging Polarimetry, published in ACS Photonics[1]. This research was conducted by the FOM Institute AMOLF and made use of the SPARC system to explore an innovative method for determining the polarization state of cathodoluminescence emission, by measuring the Stokes parameters as a function of the emission angle. While being particularly useful for understanding the behavior of light, this technique also opens up new avenues for studying various properties of inorganic materials.

In another article published in Applied Physics Letters, AMOLF and the TU Eindhoven applied the same technique to indium phosphide nanowires in order to identify the angle and polarization dependent emission[2]. The SPARC has also been used for the development of a directional metasurface of tilted plasmonic nanopillars at the Department of Applied Physics at Chalmers University of Technology in a new paper published in Nano Letters[3].

The SPARC system is evidently an effective and versatile tool for various applications in materials science and nanophotonics. For further questions, you can contact our SPARC application specialist Toon Coenen at coenen@delmic.com.

References:

[1] Angle-Resolved Cathodoluminescence Imaging Polarimetry
Clara I. Osorio, Toon Coenen, Benjamin J. M. Brenny, Albert Polman, and A. Femius Koenderink
Center for Nanophotonics, FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands
ACS Photonics, Article ASAP

[2] Azimuthally polarized cathodoluminescence from InP nanowires
B. J. M. Brenny, D. van Dam, C. I. Osorio, J. Gómez Rivas and A. Polman
Appl. Phys. Lett. 107, 201110 (2015)

[3] Directional Light Extinction and Emission in a Metasurface of Tilted Plasmonic Nanopillars
R. Verre, M. Svedendahl, N. Odebo Länk, Z. J. Yang, G. Zengin, T. J. Antosiewicz, and M. Käll
Nano Letters, Article ASAP