Last week, DELMIC's CEO Sander den Hoedt was present at the annual Focus on Microscopy (FOM) conference, which took place in Bordeaux, France. FOM is major interdisciplinary conference about advanced multi-dimensional light microscopy and image processing. This year’s successful edition can boast a total of 800 participants and almost a hundred exhibitor booths from all over the world.

The event was, as usual, a great opportunity to get to know actors in the world of microscopy. Sander donned a very special blazer featuring DELMIC’s logo. At future events, we can be identified with this blazer, so keep an eye out! 

Our next event is just around the corner: the 2017 edition of the EMAS Workshop, taking place in Konstanz on May 7 till 11. This workshop deals with microbeam analysis technologies, and cathodoluminescence will feature as one of the main topics. Toon Coenen, DELMIC's SPARC Application Specialist, will be present, showcasing his poster "The SPARC cathodoluminescence system: a platform for nanoscale photonics, geology, and materials science". If you don't want to miss it, add it to your calendar! 

We have several more microscopy events awaiting us this summer, including the EMAS Workshop, the Symposium & Workshop on Advanced In-Situ Electron Microscopy, MMC 2017, and M&M 2017.