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Delmic 博客

  • fast SEM imaging
  • 阴极发光
  • cathodoluminescence
  • cryo-electron tomography
  • 冷冻电子断层扫描
  • 冷冻电镜
  • 超快体电子显微镜
  • 自动超快体成像
  • 阴极发光探测器
  • 体电子显微镜
  • 阴极发光与地质学
  • 阴极发光成像条件
  • materials science
  • webinar
  • 阴极发光与材料科学
  • FAST-EM
  • JOLT
  • SECOM
  • g2成像
  • time-resolved cathodoluminescence
  • 一体化光电关联显微技术
  • 光子寿命探测
  • 半导体
  • 地质学
  • 大体积三维立体成像
  • 成像模式
  • 扫描电镜显微系统
  • 时间分辨阴极发光成像
  • 电镜会议
  • 网络研讨会
  • 所有话题

fast SEM imaging

工作流程优化:实现高通量可持续大规模电子显微成像

峰值采集速率并不能真实反映电镜的工作效率,因为显微镜绝大部分时间并没有花在数据收集工作,而是大量时间消耗在诸如样品交换,寻找成像兴趣区域(ROI)或调整成像参数之类的工作上。因此,更具现实意义地定义工作流效率的方法是可持续的吞吐量或简称通量。

fast SEM imaging
自动超快体扫描电镜:克服大规模成像的种种挑战
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Life science Frame 264(3)

Solutions
  • METEOR
  • FAST-EM
  • CERES Ice Shield
  • CERES Sample Preparation
  • SECOM
Workflows
  • Cryo Electron Tomography
  • High-throughput EM
  • Correlative light EM

Materials analysis Frame 264(3)

Solutions
  • SPARC Spectral
  • SPARC Compact
  • JOLT 2.0
  • LAB Cube
Techniques
  • Cathodoluminescence
Applications
  • Geology
  • Semiconductors
  • Nanophotonics
  • Quantum

Insights Frame 264(3)

  • Blog
  • Customer stories
  • Resource library
Deep dive
  • Cathodoluminescence
  • Cryo-EM
  • High-throughput EM
  • CLEM

Company Frame 264(3)

  • About Delmic
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  • Contact