DELMIC
Delmic_Black+Blue(preferred)@2x(1)
Twitter-logo Linkedin-logo Youtube-logo
  • Life Sciences arrow image

    Delmic for life sciences

    Acquire more powerful insights to progress your research

    Explore solutions

    Our solutions

    • product-icon_METEOR METEOR
    • product-icon_FAST-EM FAST-EM
    • product-icon_CERES-IS CERES Ice Shield
    • product-icon_CERES-CS-VL CERES Sample Preparation
    • product-icon_SECOM SECOM

    Workflows

    • Cryo Electron Tomography
    • High-throughput EM
    • Correlative light EM

    Insights

    • Publications
    • Blog
    • Webinars
    • White papers
    • Application notes
    • Technical notes
  • Materials Analysis arrow image

    Delmic for materials analysis

    Resolve optical properties at the nanoscale

    Explore solutions

    Our solutions

    • product-icon_SPARC-Spectral SPARC Spectral
    • product-icon_SPARC Compact SPARC Compact
    • product-icon_JOLT JOLT 2.0
    • product-icon_LAB-Cube LAB Cube

    Techniques

    • Cathodoluminescence

    Applications

    • Geology
    • Semiconductors
    • Nanophotonics
    • Quantum

    Insights

    • Publications
    • Blog
    • Webinars
    • White papers
    • Application notes
    • Technical notes
  • Why Delmic?
  • Insights arrow image

    Insights

    • Blog
    • Customer stories
    • Resource library
    • Feed

    Technique Deep Dives

    • Cathodoluminescence
    • Cryo-electron tomography
    • High-throughput EM
    • Correlative light and electron microscopy
  • Company arrow image

    What do we do?

    We aspire to achieve seamless microscopy as the standard

    Learn more

    Company

    • About us
    • News
    • Career
    • Distributors
    • Contact
Search
Get in touch
Search
hamburger close

Delmic 博客

  • 光子寿命探测
  • 阴极发光
  • cathodoluminescence
  • cryo-electron tomography
  • 冷冻电子断层扫描
  • 冷冻电镜
  • 超快体电子显微镜
  • 自动超快体成像
  • 阴极发光探测器
  • 体电子显微镜
  • 阴极发光与地质学
  • 阴极发光成像条件
  • fast SEM imaging
  • materials science
  • webinar
  • 阴极发光与材料科学
  • FAST-EM
  • JOLT
  • SECOM
  • g2成像
  • time-resolved cathodoluminescence
  • 一体化光电关联显微技术
  • 半导体
  • 地质学
  • 大体积三维立体成像
  • 成像模式
  • 扫描电镜显微系统
  • 时间分辨阴极发光成像
  • 电镜会议
  • 网络研讨会
  • 所有话题

time-resolved cathodoluminescence

如何使用时间分辨阴极发光进行光子寿命探测?

什么是时间分辨阴极发光成像?进行光子寿命探测(lifetime mapping)或者二次相关性研究(g2 analysis)能如何为您的研究增加价值?在下面的视频中,Delmic的产品经理Toon Coenen对这种成像技术及其应用进行了解释。

Delmic_Black+Blue(preferred)@2x

Life science Frame 264(3)

Solutions
  • METEOR
  • FAST-EM
  • CERES Ice Shield
  • CERES Sample Preparation
  • SECOM
Workflows
  • Cryo Electron Tomography
  • High-throughput EM
  • Correlative light EM

Materials analysis Frame 264(3)

Solutions
  • SPARC Spectral
  • SPARC Compact
  • JOLT 2.0
  • LAB Cube
Techniques
  • Cathodoluminescence
Applications
  • Geology
  • Semiconductors
  • Nanophotonics
  • Quantum

Insights Frame 264(3)

  • Blog
  • Customer stories
  • Resource library
Deep dive
  • Cathodoluminescence
  • Cryo-EM
  • High-throughput EM
  • CLEM

Company Frame 264(3)

  • About Delmic
  • News
  • Distributors
  • Careers
  • Contact