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Delmic 博客

  • 阴极发光
  • cathodoluminescence
  • cryo-electron tomography
  • 冷冻电子断层扫描
  • 冷冻电镜
  • 超快体电子显微镜
  • 自动超快体成像
  • 阴极发光探测器
  • 体电子显微镜
  • 阴极发光与地质学
  • 阴极发光成像条件
  • fast SEM imaging
  • materials science
  • webinar
  • 阴极发光与材料科学
  • FAST-EM
  • JOLT
  • SECOM
  • g2成像
  • time-resolved cathodoluminescence
  • 一体化光电关联显微技术
  • 光子寿命探测
  • 半导体
  • 地质学
  • 大体积三维立体成像
  • 成像模式
  • 扫描电镜显微系统
  • 时间分辨阴极发光成像
  • 电镜会议
  • 网络研讨会
  • 所有话题

cryo-electron tomography
使用集成的荧光显微镜来改善冷冻电子断层扫描的工作流程

fast SEM imaging
工作流程优化:实现高通量可持续大规模电子显微成像

阴极发光
时间分辨阴极发光成像如何拓宽(复合)半导体在新技术中的应用?

fast SEM imaging
自动超快体扫描电镜:克服大规模成像的种种挑战

time-resolved cathodoluminescence
如何使用时间分辨阴极发光进行光子寿命探测?

cathodoluminescence
JOLT:刚刚好是你需要的阴极发光强度探测器

cathodoluminescence
学术前沿 | 关于卤化物钙钛矿阴极发光分析的最新评论

cathodoluminescence
如何设置阴极发光的最佳成像条件?

SECOM
如何快速清晰地对胰岛β细胞成像?

电镜会议
回顾今夏Delmic参加的活动

阴极发光
特别的爱给特别的阴极发光探测器

阴极发光与地质学
为什么阴极发光成像对地质研究有重要意义?

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Delmic_Black+Blue(preferred)@2x

Life science Frame 264(3)

Solutions
  • METEOR
  • FAST-EM
  • CERES Ice Shield
  • CERES Sample Preparation
  • SECOM
Workflows
  • Cryo Electron Tomography
  • High-throughput EM
  • Correlative light EM

Materials analysis Frame 264(3)

Solutions
  • SPARC Spectral
  • SPARC Compact
  • JOLT 2.0
  • LAB Cube
Techniques
  • Cathodoluminescence
Applications
  • Geology
  • Semiconductors
  • Nanophotonics
  • Quantum

Insights Frame 264(3)

  • Blog
  • Customer stories
  • Resource library
Deep dive
  • Cathodoluminescence
  • Cryo-EM
  • High-throughput EM
  • CLEM

Company Frame 264(3)

  • About Delmic
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