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life sciences

Overcoming artifacts in cryogenic fluorescence microscopy

Cryogenic fluorescence microscopy (cryo-FLM) combined with scanning electron microscopy (SEM) makes the process of lamella milling in the cryo-electron tomography (cryo-ET) workflow more accurate and efficient. The benefit of cryo-FLM can however be compromised if the optical design of the system does not allow the users to easily overcome the artifacts inherent to fluorescence microscopy. In this blog post, we describe the role of cryo-FLM in cryo-ET, discuss the type of artifacts it is prone to, and show the solutions that prevent or remove them.