Characterization at the nanoscale is becoming increasingly important as new discoveries are made and structures are developed at smaller scales. Optical characterization alone is not sufficient to study materials at a scale smaller than the wavelength of light, and electron microscopy results in limited data. This is an issue faced by scientists in fields ranging from materials science to the geosciences.
This is why DELMIC has developed the SPARC cathodoluminescence (CL) system, which is designed to fit on a scanning electron microscope and detect CL emission using any of available five imaging modes. The SPARC is unmatched in terms of its unique features and high performance, and is recommended for any researcher that wants to keep pace with the competitive scientific community.Read more →